Findings from Shandong University Provide New Insights into Numerical Analysis
2012 APR 17 - (VerticalNews.com) -- "For the transient behavior of a semiconductor device, the modified method of characteristics finite element alternating-direction procedures with moving meshes are put forward," researchers in Shandong, People's Republic of China report.
"Some techniques, such as calculus of variations, operator-splitting, characteristic method, generalized L-2 projection, energy method, negative norm estimate and prior estimates and techniques are employed. Optimal order estimates in L-2 norm are derived for the error in the approximation solution," wrote Y.R. Yuan and colleagues, Shandong University.
The researchers concluded: "Thus the well-known theoretical problem has been thoroughly and completely solved."
Yuan and colleagues published their study in International Journal of Numerical Analysis and Modeling (The Characteristic Finite Element Alternating-direction Method With Moving Meshes For The Transient Behavior Of A Semiconductor Device. International Journal of Numerical Analysis and Modeling, 2012;9(1):86-104).
For additional information, contact Y.R. Yuan, Shandong University, Inst Math, Jinan 250100, Shandong, People's Republic of China.
Publisher contact information for the International Journal of Numerical Analysis and Modeling is: Isci-Inst Scientific Computing & Information, PO Box 60632, Univ Alberta Postal Outlet, Edmonton, Alberta T6G 2G1, Canada.
Keywords: City:Shandong, Country:People's Republic of China, Region:Asia, Electronics, Mathematics
This article was prepared by VerticalNews Mathematics editors from staff and other reports. Copyright 2012, VerticalNews Mathematics via VerticalNews.com.